Atoms measure roughly 0.1 nanometers across, a scale so small that scientists spent more than six decades developing instruments capable of resolving them with any clarity. The journey from the first ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

Using the latest in aberration-corrected electron microscopy, researchers at the Department of Energy’s Oak Ridge National Laboratory and their colleagues have obtained the first images that ...

Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation ...

A new method in electron microscopy enables sub-20-picometer targeting of individual atoms without prior exposure, opening the door to atom-specific analysis and control. (Nanowerk Spotlight) ...

A £3 million electron microscope has arrived at the University of Oxford's Department of Materials. The microscope will support research across the university's departments and divisions. It was ...

Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...