Such features can make defect tracking fun and less of a boring activity for developers. It will help developers in generating better bug reports, making the entire process of defect management easier ...

ADE Corp. earlier this week offered up its latest darkfield wafer defect inspection tool, WaverXam. The tool offers a high-sensitivity mode with 33nm defect detection to meet tightening customer ...

AUSTIN, Texas — With the cost of advanced semiconductor photomask sets approaching $1 million apiece, there is a huge need for advanced software that will snare mask defects early in the production ...

In the world of embedded software development, defects can cripple projects, delay releases, and ultimately lead to failures that affect everything from consumer electronics to mission-critical ...

“Speed is the new currency of business,” said Marc Benioff, CEO of Salesforce. In my experience, however, speed without quality is nothing but a fast track to failure. This delicate balance between ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...